A High Breakdown Voltage Two Zone Step Doped Lateral Bipolar Transistor on Buried Oxide Thick Step

نویسندگان

  • Sajad A. Loan
  • S. Qureshi
  • S. Sundar
  • Kumar Iyer
چکیده

---A novel two zone step doped (TZSD) lateral bipolar junction transistor (LBJT) on silicon-oninsulator (SOI) with buried oxide thick step (BOTS) is proposed. The concept of linear doping and linear oxide thickness for increasing the breakdown voltage has been replaced by using step in doping and step in oxide thickness. These steps result in the creation of additional electric field peaks in the collector drift region and increases the uniformity of lateral surface electric field and hence the breakdown voltage. Numerical simulations demonstrate that the breakdown voltage of the proposed device is more than 200 % higher than the conventional device

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تاریخ انتشار 2008